Cycle Time Reductions for
Test Area Bottleneck Equipment
Authors:
Steven Brown
Joerg Domaschke
Siemens AG
|
Franz Leibl
Siemens Microelectronics Center
|
Abstract:
Using discrete-event simulation models, a
study was conducted to evaluate the current
production practices of a high-volume
semiconductor assembly and test operation. The
specific goal of the study was to find
potential areas for productivity improvement
that would collectively yield a 60% reduction
in manufacturing cycle time for the back-end
factory. This paper will present findings and
measurable results pertaining to the Burn-In
and Tester operations, which are the current
factory constraints. The model shows that the
cumulative impact of these recommendations is
a 32% reduction in average cycle time, a
significant contribution to the overall goal.
Additional opportunities are being
investigated with models of the Assembly area.
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