View newsletter abstracts.

Recent newsletter topics include:

• Problems that Stem from Broken Assumptions
• Responses to Four Recent Discussion Topics
• Equipment Availability versus Equipment Uptime and Manufacturing Time

FabTime Cycle Time Management Newsletter

Newsletter main topics to date are listed below. Click on the issue title to view an abstract for that issue. There is no charge to subscribe for the current issue of the newsletter each month. Past issues are currently only available to customers of FabTime’s web-based digital dashboard software or our cycle time management course.

	The Hawthorne Effect (Issue 1.1)
	The P-K Formula (Issue 1.2)
	Little’s Law (Issue 1.3)
	Theory of Constraints (Issue 1.4)
	Theory of Constraints and Just-in-Time Manufacturing (Issue 1.5)
	Performance Measures Typically Used in Wafer Fabs (Issue 1.6)
	Improving Factory Cycle Time Through Changes at Non-Bottleneck Tools (Issue 1.7)
	Understanding the Impact of Single-Path Tools (Issue 1.8)
	Impact of Batch Size Decision Rules on Cycle Time (Issue 2.1)
	Should You Reduce Lot Sizes to Reduce Cycle Times? (Issue 2.2)
	Improving Cycle Time During a Downturn (Issue 2.3)
	In-Depth Guide to OEE Resources (Issue 2.4)
	One-Year Anniversary Issue (Issue 2.5)
	What is One Day of Cycle Time Reduction Worth? (Issue 2.6)
	The FabTime Cycle Time Characteristic Curve Generator (Issue 2.7)
	Setting Goals for Fab Performance (Issue 2.8)
	Implicitly Including Cycle Time in Capacity Planning (Issue 2.9)
	Explicitly Including Cycle Time in Capacity Planning (Issue 2.10)
	OEE and Cycle Time (Issue 3.1)
	Cycle Time and Hot Lots (Issue 3.2)
	How Much Does Tool Dedication Inflate Cycle Time? (Issue 3.3)
	Cycle Time and the Core Conflict (Issue 3.4)
	The Bottom-Line Benefits of Cycle Time Management (Issue 3.5)
	Cycle Time Management Styles (Issue 3.6)
	FabTime Newsletter Retrospective (Issue 3.7)
	A Simple Rule of Thumb for Batching Decisions (Issue 3.8)
	The Impact of Staffing on Cycle Time (Issue 3.9)
	Quality Moves: A Proposal for a New Performance Metric (Issue 3.10)
	Quantifying Wafer Fab Variability (Issue 4.01)
	Quantifying Availability Variability (Issue 4.02)
	Cycle Time Entitlement (Issue 4.03)
	Cycle Time Effects of Equipment Downtime (Issue 4.04)
	Arrival Variability and Cycle Time (Issue 4.05)
	In-Depth Guide to Operators and Cycle Time (Issue 4.06)
	Identifying Real-Time Cycle Time Problems (Issue 4.07)
	Dynamic X-Factor (Issue 4.08)
	Identifying Temporary Bottlenecks in the Fab (Issue 4.09)
	Tool Standby and Productive Time Reporting (Issue 4.10)
	Cycle Time and Factory Size (Issue 4.11)
	Cycle Time and Yield (Issue 5.01)
	Cycle Time and Yield Revisited (Issue 5.02)
	Dynamic X-Factor Revisited (Issue 5.03)
	Presenting Fab Performance Data (Issue 5.04)
	WIP Utilization Percentage (Issue 5.05)
	Cycle Time Constrained Capacity (Issue 5.06)
	Quantifying the Effect of Tool Downtime (Issue 5.07)
	Real-Time Alerting based on Fab Conditions (Issue 5.08)
	Analyzing Capacity Using MES Data (Issue 5.09)
	Management Behavior and Fab Cycle Time (Issue 5.10)
	Product Mix and Cycle Time (Issue 6.01)
	A WIP-Centered View of the Fab: Part 1: WIP States (Issue 6.02)
	A WIP-Centered View of the Fab: Part 2: Overall WIP Effectiveness (Issue 6.03)
	Lot Dispatch for Wafer Fabs (Issue 6.04)
	The Three Fundamental Drivers of Fab Cycle Time (Issue 6.05)
	Cycle Time and Holds (Issue 6.06)
	Setup Avoidance and Dispatching (Issue 6.07)
	Cycle Time and Hot Lots Revisited (Issue 6.08)
	Estimating and Using Operation Cycle Times (Issue 6.09)
	Operational Recommendations for Wafer Fab Cycle Time Improvement (Issue 6.10)
	Running Development Lots in a Production Fab (Issue 7.01)
	Operator Variability and Cycle Time (Issue 7.02)
	Cycle Time Metrics Baseline (Issue 7.03)
	Cycle Time Variability (Issue 7.04)
	Lean Manufacturing and Wafer Fabs (Issue 7.05)
	Resolving the Cycle Time vs. Utilization Conflict (Issue 7.06)
	Financial Justification for Cycle Time Improvement Efforts (Issue 7.07)
	Ways that Fabs Create Arrival Variability (and Cycle Time) (Issue 7.08)
	Seven Things You Should Know About Wafer Fab Cycle Time (Issue 7.09)
	In-Depth Guide to Cycle Time Management Resources (Issue 7.10)
	Highlighting Cycle Time Problems for New Products (Issue 8.01)
	What Makes an Effective Morning Meeting? (Issue 8.02)
	Estimating Planned Operation Cycle Times (Issue 8.03)
	Sources of Variability in Wafer Fabs (Issue 8.04)
	Conquering WIP Bubbles (Issue 8.05)
	Cluster Tools in Wafer Fabs (Issue 8.06)
	Scheduling and Dispatching in Wafer Fabs (Issue 8.07)
	Wafer Fab Flow Control via Order Release (Issue 8.08)
	Definitions for Cycle Time Benchmarking (Issue 8.09)
	A Fab Cycle Time Improvement Checklist (Issue 8.10)
	Our Top Recommendation for Cycle Time Improvement: Tackle Single Path Operations (Issue 9.01)
	Manual Lot Transfer in Wafer Fabs (Issue 9.02)
	Batch Loading Policies for Wafer Fabs (Issue 9.03)
	Dynamic X-Factor and Shipped Lot X-Factor (Issue 9.04)
	Paper vs. Electronic Lot Travelers (Issue 9.05)
	Definitions for Short-Term Line Yield Metrics (Issue 9.06)
	How To Extend the Life of Your Fabs? Measure, Monitor, and Control (Issue 9.07)
	Tool State Calculations for Cluster Tools in Fabs (Issue 9.08)
	WIP Bubbles in Wafer Fabs (Issue 9.09)
	Improving Cycle Time during a Downturn, Redux (Issue 9.10)
	Setting WIP Goals in Wafer Fabs (Issue 10.01)
	Correlation in Wafer Fab Data (Issue 10.02)
	Equipment Availability versus Equipment Uptime and Manufacturing Time (Issue 10.03)
	Responses to Four Recent Discussion Topics (Issue 10.04)
	Problems that Stem from Broken Assumptions (Issue 10.05)