FabTime Cycle Time Management for Wafer Fabs
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FabTime Cycle Time Management Newsletter

The FabTime Cycle Time Management newsletter is a forum for introducing and discussing best practices in wafer fab cycle time management. This free monthly email publication is currently distributed to more than 2700 people across the semiconductor industry. It contains technical articles related to cycle time management, as well as subscriber discussion and industry announcements. To subscribe to the newsletter, please fill in the form below and press the Submit button. There is no charge to subscribe. We guarantee that FabTime will never release your email address or other information to any third party. 

Issue 11.02 was distributed on March 2, 2010. The newsletters are normally sent 10 times per year. We are taking a short hiatus from sending out the newsletters right now, however. We will be back with new issues later this summer. Thanks for your patience.

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Newsletter main topics to date are listed below. Click on the issue title to view an abstract for that issue. There is no charge to subscribe for the current issue of the newsletter each month. Past issues are currently only available to customers of FabTime’s web-based digital dashboard software or our cycle time management course.

bulletThe Hawthorne Effect (Issue 1.1)
bulletThe P-K Formula (Issue 1.2)
bulletLittle’s Law (Issue 1.3)
bulletTheory of Constraints (Issue 1.4)
bulletTheory of Constraints and Just-in-Time Manufacturing (Issue 1.5)
bulletPerformance Measures Typically Used in Wafer Fabs (Issue 1.6)
bulletImproving Factory Cycle Time Through Changes at Non-Bottleneck Tools (Issue 1.7)
bulletUnderstanding the Impact of Single-Path Tools (Issue 1.8)
bulletImpact of Batch Size Decision Rules on Cycle Time (Issue 2.1)
bulletShould You Reduce Lot Sizes to Reduce Cycle Times? (Issue 2.2)
bulletImproving Cycle Time During a Downturn (Issue 2.3)
bulletIn-Depth Guide to OEE Resources (Issue 2.4)
bulletOne-Year Anniversary Issue (Issue 2.5)
bulletWhat is One Day of Cycle Time Reduction Worth? (Issue 2.6)
bulletThe FabTime Cycle Time Characteristic Curve Generator (Issue 2.7)
bulletSetting Goals for Fab Performance (Issue 2.8)
bulletImplicitly Including Cycle Time in Capacity Planning (Issue 2.9)
bulletExplicitly Including Cycle Time in Capacity Planning (Issue 2.10)
bulletOEE and Cycle Time (Issue 3.1)
bulletCycle Time and Hot Lots (Issue 3.2)
bulletHow Much Does Tool Dedication Inflate Cycle Time? (Issue 3.3)
bulletCycle Time and the Core Conflict (Issue 3.4)
bulletThe Bottom-Line Benefits of Cycle Time Management (Issue 3.5)
bulletCycle Time Management Styles (Issue 3.6)
bulletFabTime Newsletter Retrospective (Issue 3.7)
bulletA Simple Rule of Thumb for Batching Decisions (Issue 3.8)
bulletThe Impact of Staffing on Cycle Time (Issue 3.9)
bulletQuality Moves: A Proposal for a New Performance Metric (Issue 3.10)
bulletQuantifying Wafer Fab Variability (Issue 4.01)
bulletQuantifying Availability Variability (Issue 4.02)
bulletCycle Time Entitlement (Issue 4.03)
bulletCycle Time Effects of Equipment Downtime (Issue 4.04)
bulletArrival Variability and Cycle Time (Issue 4.05)
bulletIn-Depth Guide to Operators and Cycle Time (Issue 4.06)
bulletIdentifying Real-Time Cycle Time Problems (Issue 4.07)
bulletDynamic X-Factor (Issue 4.08)
bulletIdentifying Temporary Bottlenecks in the Fab (Issue 4.09)
bulletTool Standby and Productive Time Reporting (Issue 4.10)
bulletCycle Time and Factory Size (Issue 4.11)
bulletCycle Time and Yield (Issue 5.01)
bulletCycle Time and Yield Revisited (Issue 5.02)
bulletDynamic X-Factor Revisited (Issue 5.03)
bulletPresenting Fab Performance Data (Issue 5.04)
bulletWIP Utilization Percentage (Issue 5.05)
bulletCycle Time Constrained Capacity (Issue 5.06)
bulletQuantifying the Effect of Tool Downtime (Issue 5.07)
bulletReal-Time Alerting based on Fab Conditions (Issue 5.08)
bulletAnalyzing Capacity Using MES Data (Issue 5.09)
bulletManagement Behavior and Fab Cycle Time (Issue 5.10)
bulletProduct Mix and Cycle Time (Issue 6.01)
bulletA WIP-Centered View of the Fab: Part 1: WIP States (Issue 6.02)
bulletA WIP-Centered View of the Fab: Part 2: Overall WIP Effectiveness (Issue 6.03)
bulletLot Dispatch for Wafer Fabs (Issue 6.04)
bulletThe Three Fundamental Drivers of Fab Cycle Time (Issue 6.05)
bulletCycle Time and Holds (Issue 6.06)
bulletSetup Avoidance and Dispatching (Issue 6.07)
bulletCycle Time and Hot Lots Revisited (Issue 6.08)
bulletEstimating and Using Operation Cycle Times (Issue 6.09)
bulletOperational Recommendations for Wafer Fab Cycle Time Improvement (Issue 6.10)
bulletRunning Development Lots in a Production Fab (Issue 7.01)
bulletOperator Variability and Cycle Time (Issue 7.02)
bulletCycle Time Metrics Baseline (Issue 7.03)
bulletCycle Time Variability (Issue 7.04)
bulletLean Manufacturing and Wafer Fabs (Issue 7.05)
bulletResolving the Cycle Time vs. Utilization Conflict (Issue 7.06)
bulletFinancial Justification for Cycle Time Improvement Efforts (Issue 7.07)
bulletWays that Fabs Create Arrival Variability (and Cycle Time) (Issue 7.08)
bulletSeven Things You Should Know About Wafer Fab Cycle Time (Issue 7.09)
bulletIn-Depth Guide to Cycle Time Management Resources (Issue 7.10)
bulletHighlighting Cycle Time Problems for New Products (Issue 8.01)
bulletWhat Makes an Effective Morning Meeting? (Issue 8.02)
bulletEstimating Planned Operation Cycle Times (Issue 8.03)
bulletSources of Variability in Wafer Fabs (Issue 8.04)
bulletConquering WIP Bubbles (Issue 8.05)
bulletCluster Tools in Wafer Fabs (Issue 8.06)
bulletScheduling and Dispatching in Wafer Fabs (Issue 8.07)
bulletWafer Fab Flow Control via Order Release (Issue 8.08)
bulletDefinitions for Cycle Time Benchmarking (Issue 8.09)
bulletA Fab Cycle Time Improvement Checklist (Issue 8.10)
bulletOur Top Recommendation for Cycle Time Improvement: Tackle Single Path Operations (Issue 9.01)
bulletManual Lot Transfer in Wafer Fabs (Issue 9.02)
bulletBatch Loading Policies for Wafer Fabs (Issue 9.03)
bulletDynamic X-Factor and Shipped Lot X-Factor (Issue 9.04)
bulletPaper vs. Electronic Lot Travelers (Issue 9.05)
bulletDefinitions for Short-Term Line Yield Metrics (Issue 9.06)
bulletHow To Extend the Life of Your Fabs? Measure, Monitor, and Control (Issue 9.07)
bulletTool State Calculations for Cluster Tools in Fabs (Issue 9.08)
bulletWIP Bubbles in Wafer Fabs (Issue 9.09)
bulletImproving Cycle Time during a Downturn, Redux (Issue 9.10)
bulletSetting WIP Goals in Wafer Fabs (Issue 10.01)
bulletCorrelation in Wafer Fab Data (Issue 10.02)
bulletEquipment Availability versus Equipment Uptime and Manufacturing Time (Issue 10.03)
bulletResponses to Four Recent Discussion Topics (Issue 10.04)
bulletProblems that Stem from Broken Assumptions (Issue 10.05)
bulletForecasting Lot Completion Dates (Issue 10.06)
bulletUsing Short-Term Indicators to Improve Long-Term Performance (Issue 10.07)
bulletThe Hawthorne Effect Revisited (Issue 10.08)
bulletImproving Factory Cycle Time through Improvements at Non-Bottleneck Tools (Issue 10.09)
bulletProduct Mix and Cycle Time Revisited (Issue 11.01)
bullet100th Newsletter Issue Celebration (Issue 11.02)
 
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